Probe performs the first of several tests each component must pass before being shipped to a customer. To test the die, a probe card is positioned over each wafer. Probe needles on the card touch corresponding bond pads on the die.

Micron - Motherboard Full and Basic Testing

Two motherboards are used to perform the qualification tests; the minimum load is run in a system equipped with a single CPU while the maximum load is run in a system equipped with dual processors. Both systems use the latest BIOS revision.

Micron - Motherboard Test Results

Micron regularly performs qualifications of desktop, server, workstation, and notebook systems. As a service to our customers, this Web page lists qualified Micron module/motherboard combinations.

Micron In The News Page

DRAM DDR3 SDRAM DDR2 SDRAM DDR SDRAM SDRAM RLDRAM® Memory Mobile DRAM PSRAM CellularRAM® MCPs DRAM Modules FBDIMM RDIMM VLP RDIMM UDIMM SODIMM SOCDIMM SORDIMM VLP SORDIMM Mini-RDIMM VLP Mini-RDIMM CMOS Sensors NAND Flash e-MMC™ High-Speed NAND RealSSD™ Solid State Drive Embedded USB Part Catalog

Product Listing Page

MTFC16GHKDH-WTSampling16GBx8FBGA169-ball3.3V-25C to +85C12 x 18 x 1.4MTFC1GDKDM-ETProduction1GBx8FBGA153-ball3.3V-40C to +85C11.5 x 13 x 1.2MTFC1GDKDM-WTProduction1GBx8FBGA153-ball3.3V-25C to +85C11.5 x 13 x 1.2MTFC2GDKDM-ETProduction2GBx8FBGA153-ball3.3V-40C to +85C11.5 x 13 x 1.